The 3View^® system allows high-throughput, high-resolution imaging of a wide variety of samples in 3D. 32k x 24k image support and high-performance stages allow fully automated high-speed imaging of many different types of samples. 

• Serial block-face imaging minimizes errors and distortions found when using focus ion beam imaging or traditional serial section imaging
• Large format image support (32k x 24k) allows you to collect very large images to minimize the amount of time wasted waiting for stage motion when imaging very large regions
• <50 nm X, Y stage repeatability allows multi-region imaging without losing data due to imprecise stage motion
• 15 nm Z section thickness without the need to unblur multi-kV images
• High-performance OnPoint™ backscattered electron (BSE) detector allows high-speed imaging at low kV, without giving up image quality