The DigiScan™ 3 system provides next-generation digital image acquisition performance for scanning and scanning transmission electron microscopes (SEM/STEM). As a core component, the DigiScan 3 combines flexible digital beam control with a powerful signal extraction technology to add enhanced performance to the advanced SEM/STEM applications packages offered by Gatan.
- Connects to nearly all SEM and STEM systems and provides a universal interface
- Enables simultaneous multiple signal acquisition and unique contrast modes
- Facilitates up to 20 (4 standard) configurable synchronous inputs: analog or pulse
- Adjustable pixel image size allows you to define the X and Y dimensions, up to 32k x 32k
- User-configurable pixel dwell time enables selection from 50 ns to 400 ms per pixel