TEM analytical holders are designed for basic imaging and analytical applications, such as electron diffraction and energy dispersive x-ray spectroscopy (EDS) analysis of crystalline TEM specimens.

• A beryllium specimen cradle minimizes unwanted x-ray signals
• Cut-outs in the specimen tip are matched to the TEM configuration and provide a clear path between the sample and detector to reduce shadowing for EDS analysis
• To facilitate quantitative x-ray analysis, non-rotating holder versions are equipped with a small Faraday cup located near the specimen cradle at the tip of the holder
• Electrical connections are available for the non-rotating versions of the holder

¹ 2 – 6 for JEOL UHR, 2 – 4 for all other EMMs