Transmission electron microscope (TEM) multiple specimen holders provide increased productivity for applications that require comparable screening of multiple specimens.

• Operates at ambient temperature or cryo-temperature, depending on holder model
• Interchangeable cartridge design facilitates handling and storage of fragile specimens
• Opening on one side of FIBBEM™ cartridges allows access of the ion beam and reactive gasses to interact with the samples; cartridge can then be attached to the holder for viewing in the TEM

¹ Two specimen positions are available in holders for the Hitachi and Zeiss TEMs. Three specimen positions are available in holders for FEI and Topcon TEMs. Five specimen positions are available in holders for the JEOL TEMs.
² Small pole piece gap configuration does not have a removable cartridge.
³ Two specimen positions are available in holders for the Hitachi and Zeiss TEMs. Three specimen positions are available in holders for FEI, JEOL and Topcon TEMs.