The only fully integrated hybrid-pixel electron detector with STEMx^® for advanced four-dimensional scanning transmission electron microscopy (4D STEM) diffraction. By fully integrating the DECTRIS hybrid-pixel electron detector within the Gatan Microscopy Suite^® software, the Stela camera extends Gatan’s comprehensive 4D STEM portfolio to understand advanced materials at low kV.

One platform, many solutions

• Industry-leading Gatan Microcopy Suite software: Seamlessly integrates diffraction imaging and 4D STEM with hybrid-pixel electron detection
• Quickly turns subtle observations into bright insights: Analyze and assess results in minutes to optimize the experiment and collect the best 4D STEM dataset possible

Diffraction uncompromised

• Exceptional-dynamic range for 4D STEM: Captures weak and intense reflections to enable advanced diffraction studies
• Acquires a 4D cube at >16,000 pixels/s: 
  • Reduces specimen drift and damage
  • Covers large sample areas in less time
• Optimized for imaging at low kV: Ideal for materials that require diffraction studies at <80 kV