Model 695

Precision ion polishing system for precise centering, control, and reproducibility of your milling process.

ADVANTAGES

X,Y stage permits alignment of argon beams to region of interest on the sample
Improved collimated beam provides useable voltages as low as 100 volts for rapid and damage free preparation of FIB lamella
Digital optical imaging with image storage and analysis in DigitalMicrograph^® software
10" color touch screen for display and control of all PIPS™ II parameters