The EDAX EDS Powered by Gatan offers fully integrated data acquisition and signal processing, coupled with features to guide setup and analysis. The Elite T silicon drift detector maximizes collection efficiency and optimizes light element performance, while DigitalMicrograph® software is the industry standard for TEM/STEM experimental control and analysis across the range of imaging and analytical techniques. This powerful combination helps users achieve the best possible results in challenging conditions.

Elite T silicon drift detector

• Compact sensor geometry gets you closer to the sample, maximizing the solid angle and increasing count rates for faster data collection on sensitive samples
• Delivers outstanding resolution and minimal peak shift at all count rates for optimal deconvolution and high maximum count rate for fast mapping and time to data
• Uses windowless design to provide excellent sensitivity for low energies down to Al L

DigitalMicrograph software

• Full DigitalMicrograph integration provides a powerful, multi-dimensional, one-stop data analysis and visualization platform for all TEM/STEM applications
• Allows you to customize your analysis with native support for DigitalMicrograph scripting and Python programming
• Utilizes highly configurable data acquisition and a single palette to precisely control and simplify all acquisition workflow: areas, lines, points, and time series
• Multimodal capability consolidates all STEM data on a single platform, including energy dispersive spectroscopy (EDS), electron energy loss spectroscopy (EELS), 4D STEM, cathodoluminescence (CL), and imaging