SEM
Ilion II System
Model 697
Ideal for low energy surface preparation for your SEM cross section viewing.
ADVANTAGES
- Vacuum load-lock and liquid nitrogen cold stage to provide rapid workflows on beam sensitive samples
- Real-time observation of the polishing process including an optical microscope with digital imaging; images can be stored and analyzed with DigitalMicrograph® software from Gatan
- Repeatable results from recipes and operation of the Ilion™ II via a 10" color touch screen interface
- Damage-free surfaces for analytical techniques, such as cathodoluminescence and EBSD, where the signal is generated near the surface