Diffraction analysis package (DIFPACK) to automate the selection area of your electron diffraction (SAED) patterns and high resolution lattice images of crystalline samples.
Provides simple and accurate measurements of lattice spacings and the angle between two sets of lattice planes
Automatically tracks all measurements in different images and provides output which can be easily exported to any word processor or plotting applications
Ideal tool for performing high precision magnification calibration
Accurate peak location—Automatic peak search and refinement to sub-pixel accuracy through the use of center of mass calculation (for diffraction patterns) and interpolation (for diffractograms)
Improved diffractogram—Calculation of the diffractogram of a lattice image is preceded by masking in real-space to eliminate streaking and improve measurement accuracy
Optimized calibration—Calibrations are automatically transferred between image and its diffractogram
Center location—Center of diffraction pattern can be automatically located using a cross-correlation technique (for centro-symmetrical patterns) or be determined manually from a pair of spots located symmetrically about the central spot
Background thresholding—Background noise can be automatically distinguished from dim spots through the use of an empirically determined threshold parameter